About The Teradyne J750 Tester

Teradyne redefines the economics of test by packing power and performance into the compact, economical J750 Family of semiconductor test systems. The J750 delivers up to 1,024 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities help deliver 95% parallel test efficiency for up to 32 devices. The system features IG-XL test software, the semiconductor ATE industry's first test development suite combining the power and performance of the latest PC technology and Windows operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic.