Testing CD74HC354 Multiplexer by Using the Teradyne J750 Tester

 

 

 

 

 

 

 

 

 

 

 

 

Step 1: Creating the Channel Map

 

Before the DUT can be tested, each pin on the DUT needs to be specifically map to a channel at the Teradyne J750 tester. There are 64 digital channels and 5 power supply channels. Therefore, this tester supports chip that has up to 64 digital input and output and digital chips with multiple different supply voltage.

 

1.             The Daughter board used in this test is DJ7MDIPDS. Since this is a pre-wired daughter board, you can just attached the chip switch on the board and put your chips on the switch

 

2.             You can find out which channel connected to the pin by looking at taking a look on the board directly.

Figure 1

 

 

 

 

 

Step 2: Turning on the Teradyne J750

 

The Teradyne J750 tester is a very sensitive tester. Any electrostatic charge present on your body will destroy the tester if no extra precaution taken into consideration. Therefore ESD band is required to wear at all time of using the tester. The tester is also calibrated at 30 degrees Celsius. However, the tester is still able to function within ± 3^oC of the calibrated temperature. Therefore, make sure that the temperature of the room is within 27 ^oC and 33 ^oC.

 

1.             Press the Green Button to turn on the power supply.

     

      Figure 2: Location of the Green Button at the Power Supply Box

 

 

      Warning: DO NOT PRESS THE BUTTON WITH THE KEY. Unless in case of emergency

 

 

 

 

 

 

 

 

2.             Turn on the air valve by lifting the handle from a horizontal position to a vertical position.

 

     

      Figure 3: Snapshot on the Process to Turn on the Air Valve

 

3.             Press the power switch to turn on the computer.

 

     

      Figure 4: Snapshot of the Power Button at the Computer

 

4.             Turn on the Teradyne J750. Press and hold the green button for 5 seconds at the rear end of the Teradyne J750.

 

Figure 5: Snapshot on the Location of the Teradyne J750 Power Button

 

      Warning: Make sure that you wear the ESD protection band provided.

 

5.             To ensure the interface board is attach in a right orientation a bigger pin on the right of Teradyne J750 must go into a bigger hole of an interface board and small pin on the left of Teradyne J750 must go into a smaller pin of an interface.

 

Figure 6: Snapshot of the Interface board on the Teradyne J750

 

6.             Attach your daughter board on the interface board according to the pin designation. The daughter board is attached to Slot0 and Slot1.

 

      Figure 7: Snapshot of the Daughter Board on the Interface Board

 

7.             Lift the ledge and insert your DUT into the ZIF socket.

 

8.             Press the ledge down to lock the DUT in place.

 

      Figure 8: Snapshot of the DUT in the Daughter Board

 

9.             Turn on the vacuum by switching the ledge from the unlock position to lock position. The switch is located on the upper right hand corner of the tester.

 

Figure 9: Snapshot on the Process to Turn on the Vacuum Switch.

 

Step 3: Starting the IG-XL Program

 

The IG-XL program is the interface program between the Teradyne J750 tester and the user. This is the program where the user will enter all the various characteristics, specifications and the test pattern of the chip.

 

1.    Log onto the computer using your Engineering Account.

 

2.    Click [Start] button.

 

3.    Point to Programs.

 

4.    Choose Teradyne IG-XL V3.40.07

 

5.    Click [New Test Program].

 

     

      Figure 10: Snapshot on How to Start the IG-XL program

 

 

 

 

 

 

 

 

 

 

 

Once the program is loaded, you will see a window below:

 

     

      Figure 11: Snapshot on the IG-XL Program

Step 4: Pin Map

 

This sheet is the place where all pins of the DUT and its function will be declared.

 

1.             Click the Pin Map tab if a Pin Map is already present; itπs located at the bottom left of the IG-XL program.

 

Figure 11: Location of the Pin Map Tab.

 

2.             If the Pin Map sheet is not present in the tab options:

i.      Click [Insert].

ii.     Choose [Worksheet] and an Insert Worksheet window will appear.

 

  

   Figure 12: Snapshot of the Insert Worksheet Window.

 

 

iii.   Under the Sheet Type options choose [Pin Map]. This will create a Pin Map Sheet.

 

3.             Once the Pin Map sheet is open, enter the name of each pin in the Pin Name column.

 

4.             The type of each pin is selected at the Type column.

∑      If the pin is an input or output pin choose [I/O] as its pin type.

∑      If the pin is a power supply pin, choose [Power] as its pin type.

∑      If the pin is a ground pin, choose [Gnd] as its pin type.

∑      There are several other pin types and its functions that can be

      found in the Teradyne User Manual on page 9.

5.             Grouping of several pins can be done. However, the grouping of pins must be done to pins of the same type. Therefore, power pins cannot be group with I/O pins. Below list the steps to group multiple pins together:

∑      At the bottom of all the declaration of each Pin Name, enter a group

      name under the [Group Name] column.

∑      Enter the [pin names] of all the pins in the same group in the Pin

      Name column next to the group name. After every pin name, a new

                        pin name can be entered directly below the previous pin name.

       ≥Figure showing the pin map grouping≤

∑      Repeat step 5-ii for each other pin map group.

∑      The pin group can be expanded by clicking on the [+] symbol

      located on the left hand side of the Pin Name.

Figure 13: Location of the [+] sign

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

6.         Below shows the completed Pin Map sheet:

 

     

      Figure 14: Snapshot of a Completed Pin Map sheet

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Step 5: Channel Map

 

The tester needs to know which channel of the tester is connected to which pin of the DUT. Therefore, this sheet specifies which pin is connected to which channel on the tester.

 

1.             Click [Insert].

 

2.             Choose [Worksheet] and an Insert Worksheet window will appear.

 

3.             Under the Sheet Type option select [Channel Map].

 

4.             Click [OK].

 

5.             The Insert Channel Map windows will appear; enter [1] in the Number

      of Sites option.

 

6.             Click [OK]. The Channel Map sheet will appear.

 

                  Figure 15: Snapshot of the Insert Worksheet Window.

 

7.             Under the Pin Name column, enter all the specified pin names.

∑      The pin names are the names that you assigned previously in the

Pin Map sheet.

 

8.             Under the Type column, enter the type of all the pins.

∑      The type of the pins should be the same type as the ones in the Pin

Map sheet.

 

NOTE: The selection window of the Ground pin is grayed out and no selection is needed

 

9.             In the Site 0 column, enter the respective channel mapping for each pin.

∑      This channel mapping should correspond to the channel map that

you made in Section 1.

 

10. Below is a snapshot of a completed Channel Map.

 

Figure 16: Snapshot of a complete channel map.

Step 6: Global Spec Sheet

 

This sheet is the place where all global variables will be declared.

1.             Click the [Global Spec] tab if a Global Spec is already present, itπs

      located at the bottom left of the IG-XL program.

 

Figure 17: Location of the Global Spec Tab.

 

2.             If the Global Spec sheet is not present in the tab options:

∑      Click [Insert].

∑      Choose [Worksheet] and an Insert Worksheet window will appear.

 

           

   Figure 18: Snapshot of the Insert Worksheet Window.

 

∑      Under the Sheet Type options choose [Global Spec]. This will       

      create a Global Spec Sheet.

 

3.             Usually no modification is needed to make on the Global Spec sheet. However, we have added two values which will be used by the pin level later. They are gl_Isc and gl_Tdelay. The values are set to 500m and 2m respectively. These are default values.

 

 

 

 

 

 

4.             Below is a snapshot of a completed Channel Map.

 

Figure 19: A Snapshot of a Complete Global Spec sheet.

 

Step 7: DC Spec Sheet

 

This sheet is the place where all DC specification variables will be declared.

 

1.             Click [Insert].

 

2.             Choose [Worksheet] and an Insert Worksheet window will appear.

 

3.             Under the Sheet Type option select [DC Spec].

 

4.             Click [OK].

 

5.             An Insert AC or DC specification windows will open.

 

6.             Under the Initial Number of Categories option, enter [2].

 

7.             Click [OK].

Note: The category option is to specify what value each DC specification variable will be used for a specific test. Two categories are selected because one category is needed for the continuity test and the other for the functional test.

 

8.         Enter a DC specification variable in the Symbol Column. It can be taken from the Data sheet of the DUT. From the datasheet, we can find out the value of Vih, Vil, Voh, Vol at Vcc=4.5V, tempature = 25 Degree Celsius.

 

9.         In the Selector column and Selector sub column enter a Global reference variable.

∑      This variable is usually the same for all DC specification and AC

specification variables. This Global reference variable is to

reference a group of desired test variable for a specific test.

 

10.      In the Selector column and Val sub column, choose the corner for each DC specification. The options are typ (typical), min (minimum) and max (maximum). Preferably, choose [typ].

 

11.          Now, the two categories need to be filled. Before any category is filled, rename cat0 to Functional Test and cat1 to Zero Spec.

 

12.          Click on the [+] located on the top of each category. This will expand the category window.

Figure 21: A snapshot on the location of the å+π symbol in the DC Spec sheet.

 

13.      In the Commercial category enter the typical, minimum and maximum value for each DC Spec variable.

∑      These values can be found in the data sheet. If there is no value for a particular corner, you may leave the column at [#N/A].

 

14.      In the Zero_Spec category, fill 0πs on every block

 

15.      Below is a snapshot of a complete DC specification sheet:

Figure 22: Snapshot of a complete DC specification sheet.

 

Step 8: AC Spec Sheet

 

This sheet is the place where all AC specification variables will be declared (e.g. propagation delay and transition time).

 

1.             Click [Insert].

 

2.             Choose Worksheet and an Insert Worksheet window will appear.

 

3.             Under the Sheet Type option choose [AC Spec].

 

4.             Click [OK].

 

5.             An Insert AC or DC specification windows will open.

 

6.             Under the Initial [Number of Categories] option, enter [1]

 

7.             Click [OK].

 

8.             Enter an AC specification variable in the Symbol column. It can be taken from the Data sheet of the DUT.

 

Figure 23:            Snapshot of the Location of the AC specification variable in the Datasheet.

 

9. In the Selector column and Selector sub column enter a Global reference variable.

∑      This variable is usually the same for all DC specification and AC specification variables.

∑      This Global reference variable is to reference a group of desired test variable for a specific test.

 

10. In the Selector column and Val sub column, choose the corner for each AC specification. The options are typ (typical), min (minimum) and max (maximum).

 

11. Now, the category needs to be filled. Before any category is filled, rename cat0 to Commercial.

 

12. Click on the [+] located on the top of each category. This will expand the category window.

 

 

Figure 24: A snapshot on the location of the å+π symbol in the AC Spec sheet.

 

13. In the Commercial category enter the typical, minimum and maximum value for each AC Spec variable.

∑      These values can be found in the data sheet. If there is no value for a particular corner, you may leave the column at [#N/A]. You may see that there are two rows of Tplh,Tphl. Itπs because the chip has different propagation delays from different input. To make things simple, we select the one with the highest value.

 

Figure 25: Snapshot of the Location of the AC specification values in the Datasheet.

 

14.          Figure 26 is a snapshot of a complete AC specification sheet:

Figure 26: Snapshot of a complete AC specification sheet.

 

Step 9: Level Sheet

 

The level sheet is the sheet where the user specifies what voltage level is acceptable for a high and low logic level.

 

1.             Click: [Insert].

 

2.             Choose [Worksheet] and an Insert Worksheet window will appear.

 

3.             Under the [Sheet Type] option select Pin Level

 

4.             Click [OK].

 

                  Figure 27: Snapshot of the Insert Worksheet Window.

 

5.         In the Pin Group column enter the [pin groups] that represent all the pins on the DUT. These pin groups are the pin groups from the Pin Map sheet. You cannot declare pins multiple times in the Level sheet. Usually, the Pin group will be All Inout Pins and Vcc.

 

6.         Once the pin group name is entered, the various parameters that associates with the pins needs to be entered.

∑      For Input pins the following categories need to be filled:

                                                     I.     Vdrivelo

                                                      II.     Vdrivehi

                                                        III.     Vph

                                                        IV.     Iph

                                                       V.     Tpr

∑      For Output pins the following categories need to be filled:

                                                     I.     VcompareLo

                                                      II.     VcompareHi

                                                        III.     Isource

                                                        IV.     Isink

                                                       V.     Vthreshold

                                                        VI.     VCH

                                                          VII.     VCL

 

 

∑      For Vcc pins the following categories need to be filled:

                                                I.         Vps

                                                  II.         Isc

                                                   III.         Tdelay

 

7.         All these values can be found in the data sheet of the DUT. If the values can be found in the DUT, be sure that you enter the value in the respective sheet (most probably DC sheet) and reference the value with a variable.

∑      To reference the value with a variable, enter:=[_variableName]

∑      Be sure that the you enter [=_] then only the variable name.

 

8.         Below is a snapshot of a completed level sheet:

Figure 28a: Snapshot of the completed level sheet (Formula View)

 

 

Figure 28b:formula view button

Figure 28c: Snapshot of the completed level sheet (Value View---Value for Func_nom_DPS is shown)

Step 10: Time Set Basic Sheet

 

The Time Set Basic sheet is used to declare when the test data will be entered into the DUT and when the output of the DUT is measured.

 

1.             Click [Insert].

 

2.             Choose [Worksheet] and an Insert Worksheet window will appear.

 

3.             Under the Sheet Type option select [Time Sets (Basic)].

 

4.             Click [OK].

                        Figure 29: Snapshot of the Insert Worksheet Window

 

5.             An Insert Timing Sheet window will appear. Choose [Extended

Timing (50 MHz)].

 

6.             Click [OK].

∑      Normal Timing only allows one point measurement

∑      Extended Timing allows window type measurement

 

      Figure 30: Snapshot of the Insert Timing Sheet Window

 

7.             Once the Time Set Basic sheet appears, enter a timing variable in the Time Set column.

∑      This variable will be used later on in the Pattern Tool. Out timing variable name is ≥time_fun≤.

 

8.             Under the column Cycle and sub column Period, enter the period of one test.

∑      For instance, Period = 1*us.

 

9.         In the Pin Group and sub column name, enter the Pin Group name that will use this timing set. One group is called ≥Output≤, another group is called ≥ctrl≤

 

10.      Next, in the Data column choose PAT for the Src sub-column and NR for the Fmt column.

 

11.      The next column is the Drive column.

∑      Under the On sub-column, you will specify when you want to start the test period. Normally, a [zero] will be entered into this column. However, if you would like to delay your test period you can enter a [non-zero] value in this column.

∑      In the Data column, you will specify when you would like to input the data into the DUT. We enter 10e-9 in this example

∑      You will enter when do you want to stop the test in the Off sub-column. Usually, the length of the period will be the same as the Off time.

 

12.      The last column that needs to be filled is the Compare column

∑      Under the Mode sub-column, you will specify what type of compare mode you would like to use (eg. window and extended). Normally, the [window] option is chose because the data is measured in a window manner. However, if you would like to measure your data in at an instant, you can choose the option [extended]. The option extended allows you to test your DUT at 100MHz and the option window only allows you to test your DUT at 50MHz. As we would like to measure the output, we set ≥crtl≤ group to ≥off≤ and set ≥Output≤ group to ≥Window≤

∑      Under the Open sub-column, you will specify when you would like to start measuring your output data. Both Extended and Window modes need to fill out this column. We set it 500e-9

∑      Under the Close sub-column, you will specify when you would like to stop measuring your output data. Only [Window] mode needs to fill out this column. We set it 1e-6

 

13.      Below are the snapshots of a complete Time Set Basic sheet.

Figure 31a: Snapshot of the Insert Timing Sheet Window

Figure 31b: Snapshot of the Insert Timing Sheet Window

 

 

Step 11: Pattern Tool

 

The Pattern Tool is the program that allows the user to specify the inputs of the DUT for a specific test.

 

1.   Click on the [11^th] button from the left on the IG-XL toolbar.

∑      This will open up the Pattern Tool Program.

 

Figure 32: Snapshot of the location of the IG-XL Window.

 

2.         Click on the [File] ‡ [New].

∑      This will open a new Pattern program.

Figure 33: Snapshot of Pattern Tool Program location of the File and New option.

3. Click on the [Options] tab in the new Pattern Tool Program.

∑      This tab is located on the bottom left of the new Pattern Tool Program.

Figure 34: Snapshot of the location of the Pattern Tool tabs.

 

4.         In the Options tab window, choose the option [Extended] at the Opcode Mode option if you test mode in your Time Set Basic set is extended. Otherwise, choose [Normal].

Figure 35: Snapshot of the Option Tab Window in the Pattern Tool

 

 

5. Click [File] ‡ [Read Pinmap].

∑      This will open up an Open Pinmap window.

 

6.         Click on the [Browse] button and select your test program. Click [OK].

 

Note: You need to enter your Pin Map name in the Open Pinmap window if you did not use the default name when you create your Pin Map sheet in the IG-XL program.

Figure 36: Snapshot on the Read Pinmap Option.

 

Figure 37: Snapshot on the Open Pinmap Window.

 

7.   Click on [Pin List] at the Pattern Tool tabs. Then click on [Edit] ‡

[Edit Vector Structure].

      Figure 38: Snapshot on the Edit Vector Structure Option

 

8.         Click on [Edit] ‡ [Insert Rows] ‡ [Insert Rows].

∑      Repeat this process for each input and output pin. If you have pin groups, you only need to repeat this process twice; one for your input group and the other for your output group. In summary, repeat this process till you have fully covered all the required pins.

 

Figure 39: Snapshot on the Insert Row Option

Below is the snapshot of the result of Step xii:

Figure 40: Snapshot of the Result of Step xii

 

9.         Click on Row1-Name blank column.

∑      A symbol that looks like square with triple dots in it will appear.

10.      Click on that symbol and a Pins Edit window will appear. Check the [$tset] button and click [OK]. Under the Radix column and on the same row, select the option [D](decimal).

Figure 41: Snapshot of Pins Edit Window

11.      Click on Row2-Name blank column.

∑      A symbol that looks like square with triple dots in it will appear.

 

12.      Click on that symbol and a Pins Edit window will appear. Under the Pin or pin group name and select A1. Click [OK]. Under the [Radix] column and on the same row, select the option [S] (symbolic).

Figure 42: Snapshot of Pins Edit Window, selecting a Pin or Pin Group Name

 

13. Repeat Step 9-12 till all the pins of the DUT is covered.

Figure 42b: Snapshot of completed Pin List

 

Next click the tab Imports. Once, you are in the Imports window.

Click Edit.

Point to Insert Rows and choose Insert Rows. A new row will appear in the Imports window.

In the new Row created and under the Type column, choose tset. Next under the Symbol column, enter the timing variable from the Time Set Basic sheet that you would like to use to test the DUT. The name should be ≥time_fun≤ in this example

 

Figure 43: Snapshot of the Imports Window

 

Repeat Step xx-xxiii for each other timing variable that you would like to use.

Figure 44: Snapshot of a Completed Imports Window

 

Now, click the Vectors tab. In this window, you will specify the testing pattern of the DUT. Once you are at the Vectors window.

Click Edit.

Choose Update Vector Structure. Then click on the Title row like below.

To enter the first test pattern clicks on the Title row like in Figure 32 and click Edit.

Point to Insert Rows and choose Insert Vectors. This will create a new test pattern row.

To create more test pattern row, click on the new test pattern row and click Edit.

Point to Insert Rows and choose Insert Vectors. Repeat this process for as many test pattern rows that you need.

Figure 45: Snapshot of the location of the Title Row in the Vectors Window.

 

Once you have entered the entire test pattern row needed, you now need to fill in those test pattern rows.

The first test pattern row entry should have a Start label. To create a start label, click on the Label column of the first row. A window will appear, choose start label and enter a start variable in the vacant column. Then click OK.

The last column of the test pattern row should have a halt command. To create a halt command, click on the pattern microcode column of the last row. A window will appear, choose halt and click OK.

 

In the first test pattern row column, select the timing variable that you would like to use for this particular test pattern. You can choose from the pull down option at the tset column.

 

Figure 46: Snapshot of the location of the tset option column in the Vectors Window.

 

Click on the next columnπs button (the one with three dots in it). This will open the Pin Data Edit window. In the Pin Data Edit window, there is 16 symbolic option buttons.

If the pin that you chose was an input pin and you would like to specify a high for the input, click [1]. Otherwise click [0].

If the pin that you chose was an output pin and you would like to expect a high at the output, click [H]. Otherwise click [L].

If you do not care what logic the pin is at, click [X].

Click OK once you complete selecting the symbolic states.

 

Figure 47: Snapshot of the Pin Data Edit Window.

 

Repeat Step xxxiv for each other Pin or Pin group you have on the same row.

Out Test case is the change the input D0-7 continuously and let all the Enable signal turns on. We try to change the selections to see if the output changes correctly.

 

Figure 48a: Testcase

Figure 48b: Testcase

 

Now, click File.

Choose Save As and save to a file. You will use this file later.

 

Step 10: Setting up Continuity Test

The continuity Test is the test that will check whether the DUT is connected to the tester.

 

Click the Test Instances tab if is already present; itπs at the bottom left of the IG-XL program.

Figure 49: Location of the Test Instances Tab.

If the Test Instances sheet is not present in the tab options:

Click Insert.

Choose Worksheet and an Insert Worksheet window will appear.

Under the Sheet Type options choose Test Instances. This will create a Test Instances Sheet.

In the Test Instances Sheet, enter a new [Test Name] at an empty row. We use ≥Continuity≤ here Next, under the Type column, choose IG-XL template. Also under the Name column, choose PinPmu_T. Lastly, in the Called As column choose Excel Macro.

Next, click on the symbol with three dots. Itπs located next to the test name. This will open the PinPmu Instance Editor. In the PinPmu Instance Editor window, click on the ≥ä≤ next to the pinlist and select ctrl and output. Also set the PPMU value as the graph. They are default value.

Figure 50a: Continuity Instance Argument.

Now click on the ≥Levels&Timing≤ tab and fill the textbox as the figure described below

Figure 50b: Continuity Instance Argument.

Click ≥OK≤

 

 

Step 11: Functional Test

The functional test is the test that will check whether the DUT is functioning according to its design.

 

 

In the Test Instances Sheet, enter a new [Test Name] at an empty row. Our name is Func_nom_DPS. Next, under the Type column, choose IG-XL template. Also under the Name column, choose Functional_T. Lastly, in the Called As column choose Excel Macro.

 

Next, click on the symbol with three dots. Itπs located next to the test name. This will open the Functional Instance Editor. In the Functional Instance Editor window, click on the Disk Patterns option and choose your Pattern Tool file that you had created in Step 9. We have called it ModifiedMUX.PAT. Next choose the Levels&Timing tab in the Functional Instance Editor window.

Under the TimeSet pull-down option, choose your TSB (Time Set Basic) sheet.

Under the Levels pull-down option, choose your Levels sheet.

Under the AC Selector pull-down option, choose the Selector name that you specified in the AC sheet. It is called max_AC.

Under the AC Category pull-down option, choose the Category name that you specified in the AC sheet which will be used for a functional test. It is called Commercial.

Under the DC Selector pull-down option, choose the Selector name that you specified in the DC sheet. Itπs called vcc_nom

Under the DC Category pull-down option, select the Category name that you specified in the DC sheet which will be used for a functional test. It is called Commercial.

      Figure 51a: Snapshot of the Functional Instance Editor.

 

Next you may click on the Pins tab in the Functional Instance Editor. In this tab window, you may specify the initial conditions of the pins. If you need to specify initial conditions. We have set the initial case as follow

      Figure 51b: Snapshot of the Functional Instance Editor.

 

Click OK once you are done. The figure below is the snapshot of a completed Test Instances Sheet.

     

Figure 52: Snapshot of a Completed Test Instances sheet.

 

Step 12: Flow Table

The Flow Table is the sheet that informs the Tester which program from the Test Instances sheet will be executed.

 

Click the Flow Table tab if is already present; itπs at the bottom left of the IG-XL program.

 

Figure 53: Location of the Flow Table Tab.

 

If the Flow Table sheet is not present in the tab options:

Click Insert.

Choose Worksheet and an Insert Worksheet window will appear.

Under the Sheet Type options choose Flow Table. This will create a Flow Table Sheet.

 

In the Flow Table sheet, enter the [Test Name] that you would like the tester to test in the Parameter column. This test name is the same name that you specified earlier in the Test Instances sheet. It is ≥Continuity≤ and ≥Func_nom_DPS≤ in our case

 

For each Test Name that you have entered, choose Test under the Opcode column.

 

And put an Opcode ≥stop≤ at the end

 

Below shows a completed Flow Table:

 

 

            Figure 54: Snapshot of a Completed Flow Table sheet.

 

Step 13: Datalog

The datalog is an option in the IG-XL program that tells the tester to display the output on the screen.

 

First, open the Datalog window by clicking on the 10^th button from the left on the IG-XL toolbar. A DataCollect Setup Window will appear.

 

      Figure 55: Snapshot on the location of the Datalog Option

 

Check the Datalog option at the Data Collect option.

 

Figure 56: Snapshot on the location of the Datalog Option in the DataCollect Setup Window

 

Now click on the Datalog tab that is located on the top left of the DataCollect Setup window. Click on the Setups button. This will open the Datalog Setups window.

Figure 57: Snapshot on the location of the Setups Option

 

In the Datalog Setups window, click on the Parametric Test tab that is located on the top left corner of the window. Then click on the Default option under the Selected Setups column. Lastly, click on the Editä button and Parametric Test Setup window will open.

Figure 58: Snapshot on the Datalog Setups (Parametric Test Tab) window

 

In the Parametric Test Setup window, under the Display Format pull down option, choose test name, results and limits. This will show the complete details on the results of the continuity test. Then click OK.

 

           

      Figure 59: Snapshot on the Parametric Test Setup window

 

Back at the Datalog Setups window, click on the Functional Test tab that is located on the top left corner of the window. Then click on the Default option under the Selected Setups column. Lastly, click on the Editä button and Functional Test Setup window will open.

     

      Figure 60: Snapshot on the Datalog Setups (Functional Test Tab) window

 

In the Functional Test Setup window, under the Display Format pull down option, choose test name, results and details. Then check all the options on the right of the pull down option. This will show the complete details on the results of the Functional test. Then click OK.

 

      Figure 61: Snapshot on the Parametric Test Setup window

 

Back at the Datalog Setups window, click OK.

 

Step 14: Running the Test Program

Several basic steps needed to be taken to run the test program that you have just created.

 

First, click on the 5^th button from the left on the IG-XL toolbar. This is the validate button that will check your program for any errors. If an error occurs, an Error sheet will appear. Fix the errors before continuing to the next step.

 

Figure 62: Snapshot on the location of the Validate Button

 

Second click on the 15^th button from the left on the IG-XL toolbar. This is the Run TDR button that will find the round trip delay from the tester to the DUT.

 

Figure 63: Snapshot on the location of the Run TDR Button

 

Lastly, click on the 7^th button from the left on the IG-XL toolbar. This is the Run button that will execute the test program.

 

Figure 64: Snapshot on the location of the Run Button

 

Once the program is done executing, the Teradyne_IG-XL_DataCollect - OutputWin window will appear. This is the window that shows the result of the test.

 

Figure 65 shows the result of the continuity test. The red box shows the measured result of the test for each pin. The green box shows the results of the continuity test for each pin.

Figure 65: Snapshot of the Results Window on the Continuity Test.

 

Figure 66 shows the result of the Functional test. The red box shows the measured result of the test for each pin. The green box shows the results of the functional test for each pin. The blue box shows the overall result of the Functional test.

Figure 66: Snapshot of the Results Window on the Functional Test.