Section 1: Creating Channel Map

1. Follow the section 1 in the ≥Basic Steps to Use the Teradyne J750

Tester≤ cookbook.

2. Below is the channel map for RAM CY7C128A-25

Table 1: Channel map for RAM.

Pin Name	Site 0
A7	ch23
A6	ch21
A5	ch19
A4	ch17
A3	ch31
A2	ch29
A1	ch27
A0	ch25
IO0	ch7
IO1	ch5
IO2	ch3
GND
IO3	ch40
IO4	ch42
IO5	ch44
IO6	ch46
IO7	ch32
CEbar	ch34
A10	ch36
OEbar	ch38
WEbar	ch56
A9	ch58
A8	ch60
Vcc	dps0_s

Section 2: Creating Pin Map

1. Enter the name of each pin( shown in the Pin Name column in section 1) in the Pin Name column.

2. Choose the type of each pin at the Type column.

∑ Enter [I/O] for all the pins.

∑ Enter [gnd] for GND pin.

∑ Enter [power] for Vcc pin.

3. Group the pins into group at the Group Name column. The pin group can be expanded by clicking on the [+] symbol located on the left hand side of the Pin Name.

∑ Under the group Decoder, we group A0,A1,A2,A3,A4,A5,A6,A7,A8

A9 and A10.

∑ Under the group InOut, we group IO0,IO1,IO2,IO3,IO4,IO5,IO6,IO7

∑ Under the group Controls, we group CEbar, OEbar and WEbar.

∑ Under the group All, we group all the pin in this group.

4. Enter the comment that need to be take note under Comment column.

∑ A4, A5, A6 and A7 would be row decoder.

∑ A0, A1, A2 and A3 would be the column decoder.

∑ IO0, IO1, IO2, IO3, IO4, IO5, IO6 and IO7 would be Input/Output

Port.

∑ A8, A9 and A10 would be Row Decoder.

∑ CEbar would be Low Chip Enable.

∑ OEbar would be Low Output Enable.

∑ WEbar would be Low Write Enable

∑ Vcc would be power supply.

∑ GND would be ground pin.

Figure 1: Snapshot of the Pin Map for RAM

Section 3: Creating Channel Map

1. Enter all the pins at the Pin Name column.

∑ The pin names are the names that you assigned previously in the

Pin Map sheet.

2. Enter the type for the entire pin at the Type column.

∑ Enter [I/O] for all the pins.

∑ Enter [gnd] for GND pin.

∑ Enter [power] for Vcc pin.

3. Enter the respective channel mapping for each pin at the Site 0 column.

∑ This channel mapping should correspond to the channel map that

created in Section 1.

Step 3

Step 2

Step 1

Figure 2: Snapshot of a complete channel map.

Section 4: Creating Global Spec Sheet

Usually no modification is made to the Global Spec sheet. However, read the ≥Basic Steps to Use the Teradyne J750 Tester≤ cookbook if you would like to make changes to the Global Spec sheet.

1. Enter a variable in the Symbol column.

2. Enter the value in the Value column.

Figure 3: Snapshot of a Complete Global Spec sheet.

Section 5: DC Spec Sheet

1. Enter a DC specification variable in the Symbol column.

∑ It can be taken from the Data sheet of the DUT.

Figure 4: Snapshot of the Location of the DC specification variable in

the Datasheet

2. Rename cat0 to CY7C128A-25 and cat1 to Zero Spec.

3. Click on the [+] located on the top of each category.

∑ This will expand the category window.

4. Enter the typical, minimum and maximum value for each DC Spec variable In the CY7C128A-25 category.

∑ These values can be found in the data sheet.

If there is no value for a particular corner, leave the column at [#N/A].
You can follow the value in the window below.

5. Enter all zero for each column in the zerospecs category.

6. Choose the corner for each DC specification in the Val sub-column.

∑ Choose all [Typ] for this case. When choose Typ, all the value will automatically change to the value in Typ cplumn.

Step 6

Step 1

Step 2

Step 4

Step 5

Figure 5: Snapshot of a complete DC specification sheet.

Section 6: Create AC Specs Sheet

1. Enter the symbol in the Symbol column.

∑ It can be taken from the Data sheet of the DUT.

Figure 6: Snapshot of the Location of the AC specification variable in the

Datasheet.

2. In the Selector column, there are two sub-columns which are Name and Val.

∑ In Name sub-column, choose [Typical] for all the pins

∑ In Val sub-column, choose [Max] for tAA, tACE, tDOE, tHZOE,

tHZCE, tPD and tHZWE.

∑ In Val sub-column, choose [Min] for tOHA, tLZOE, tLZCE, tPU,

tWC, tSCE, tAW, tHA, tSA, tPWE, tSD, tHD and tLZWE.

3. Rename cat1 to CY7C128A-25.

4. Click on the [+] located on the top of each category.

∑ This will expand the category window.

5. Enter the typical, minimum and maximum value for each AC Spec

variable.

∑ These values can be found in the data sheet.

∑ If there is no value for a particular corner, leave the column at

[#N/A].

Step 5

Step 1

Step 2

Figure 7: Snapshot of a complete AC specification sheet.

Section 7: Level Sheet

1. Enter all group names in the Pin/Group column.

∑ These pin groups are the pin group from the Pin Map sheet which are Decoder, InOut, Controls and Vcc.

2. Click the [+] at the side and enter the various parameters that

associates with the pins.

∑ For Decoder, InOut and Controls pins the following categories need to be filled in the parameter column:

i. Vdrivelo

ii. Vdrivehi

iii. VCompareLo

iv. VCompareHi

v. Isource

vi. Isink

vii. Vthreshold

viii. VCH

ix. VCL

x. Vph

xi. Iph

xii. Tpr

∑ For Vcc pins the following categories need to be filled:

i. Vps

ii. Isc

iii. Tdelay

3. All these values can be found in the data sheet of the DUT. Below is the value for all those parameter.

I/O Pins : Vdrivelo = 0
I/O Pins : Vdrivehi = 5V
I/O Pins : VcompareLo = 0.4V
I/O Pins : VcompareHi = 2.4V
I/O Pins : Isource = 0.000001A
I/O Pins : Isink = -0.000001A
I/O Pins : Vthreshold = 1.4V
I/O Pins : VCH = 7.6V
I/O Pins : VCL = -2.6V
I/O Pins : Vph = 5V
I/O Pins : Iph = 0
I/O Pins : Tpr = 0.000016s
Vcc Pins: Vps =5
Vcc Pins: Isc = 0.1
Vcc Pins: Tdelay = 1ns

Step 3

Step 1

Figure 8: Snapshot of a completed level sheet:

Section 8: Time Set Basic Sheet

1. Enter [TPD_Test] in the Time Set column.

∑ This variable will be used later on in the Pattern Tool. The variable should portray some identity on what test you are planning to do. I this test we use [Tpd]

2. Enter the [200E-9] at the Period sub-column.

3. Enter [All] at the Name sub-column.

4. Select [PAT] at the Src sub-column and [NR] at the Fmt column.

5. Enter the following value at the Drive column.

∑ Enter a [0], at On sub-column.

∑ Enter [10E-09], at the Data sub-column.

∑ Enter [200E-09], at the Off sub-column.

6. Enter the following value at the Compare column.

∑ Select [Window] mode, at Mode sub-column.

∑ Enter [100E-09], at the Open sub-column.

∑ Enter [150E-09], at the Close sub-column.

Figure 9: Snapshot of a Time Set Basic sheet of RAM

Section 9: Pattern Tool

1. Click on the [11^th] button from the left on the IG-XL toolbar.

∑ This will open up the Pattern Tool Program.

Figure 10: Snapshot of the location of the IG-XL Window.

2. Click on the [File] ‡ [New].

∑ This will open a new Pattern Tool program.

Figure 11: Snapshot of Pattern Tool Program location of the File and New option

3. Click on the [Options] tab in the new Pattern Tool Program.

4. Enter the location of the file at the output file. In this case, the file is save in U:\EE 491\Ram Test\ram.PAT.

5. Select the option [Extended] at the Opcode Mode.

Figure 12: Snapshot of the Option Tab Window in the Pattern Tool

6. Click [File] ‡ [Read Pinmap].

∑ This will open up an Open Pinmap window.

Figure 13: Snapshot on the Read Pinmap Option

6. Click on the [Browse] button and select your test program. Click [OK].

Note: You need to enter your Pin Map name in the Open Pinmap window if you did not use the default name when you create your Pin Map sheet in the IG-XL program.

Figure 14: Snapshot on the Open Pinmap Window.

7. Click on [Pin List] at the Pattern Tool tabs. Then click on [Edit] ‡

[Edit Vector Structure].

Figure 15: Snapshot on the Edit Vector Structure Option

8. Click on [Edit] ‡ [Insert Rows] ‡ [Insert Rows].

∑ Repeat this process for fours times.

Figure 16: Snapshot on the Insert Row Option

Figure 17: Snapshot of the Result of Step 8

9. Click on [Row1-Name] blank column.

∑ A symbol that looks like square with triple dots in it will appear.

10. Click on that symbol and a Pins Edit window will appear. Check the [$tset] button and click [OK]. Under the Radix column and on the same row, select the option [D] (decimal). Under the Pin Count column, enter [0].

Figure 18: Snapshot of Pins Edit Window

11. Click on [Row2-Name] blank column.

∑ A symbol that looks like square with triple dots in it will appear.

12. Click on that symbol and a Pins Edit window will appear. Under the Pin or pin group name and select [Decoder]. Click [OK]. Under the Radix column and on the same row, select the option [S]. Under the Pin Count column, enter [11].

Figure 19: Snapshot of Pins Edit Window, selecting a Pin or Pin Group Name

13. Repeat Step 12 for Controls and InOut pins.

14. Click the tab [Imports]. Once, you are in the Imports window, click [Edit] ‡ [Insert Rows] ‡ [Insert Rows].

∑ A new row will appear in the Imports window.

15. Select [tset] at the Type column.

16. Enter the timing variable from the Time Set Basic sheet that is [Tpd] at the Symbol column.

Figure 20: Snapshot of a Completed Imports Window

17. Click the [Vectors] tab.

∑ In this window, you will specify the testing pattern of the DUT.

18. In the Vectors window, click [Edit] ‡ [Update Vector Structure]. Then click on the Title row like below.

Figure 21: Snapshot of the location of the Title Row in the Vectors Window.

19. Click [Edit] ‡ [Insert Rows] ‡ [Insert Vectors].

∑ This will create a new test pattern row.

∑ To create more test pattern row, click on the new test pattern row

and click [Edit] ‡ [Insert Rows] ‡ [Insert Vectors].

∑ Repeat this process for three times until you get four rows as shown below.

Figure 22 : Rows that needed in the Pattern Tool

20. Fill in label column.

∑ To create a start label, click on the Label column of the first row. A window will appear, select [start_label] and enter [The Beginning] in the vacant column. Then click [OK].

21. Fill in the patgen microcode column.

∑ The last column of the test pattern row should have a halt command. To create a halt command, click on the [patgen microcode] column of the last row. A window will appear, select halt and click [OK].

22. Fill in the tset column.

∑ Select [Tpd] for this particular test pattern.

∑ This selection can be done by clicking on the pull down option at

the tset column.

Figure 23: Snapshot of the location of the tset option column in the Vectors

Window.

23. Fill in the Decoder:S, Controls:S and InOut:S column.

∑ Decoder:S is an input pin and specify a low for the input, click [10000000111].

∑ Control:S is an input pin and specify a low for the input, click [010].

∑ InOut:S is an output pin and specify a low for the output, click [10101010].

∑ Click [OK] once you complete selecting the symbolic state/s.

Figure 24: Snapshot of the Pin Data Edit Window.

24. Repeat Step 23 for another set of Decoder:S, Controls:S and InOut:S.

∑ You will get a table as shown below.

Figure 25: Snapshot of a Completed Vectors Window

25. Now, click [File] ‡ [Save As] and save to a file. You will use this file at Section 10.

Section 10: Continuity Test

The continuity Test is the test that will check whether the DUT is connected to the tester.

1. Click the [Test Instances] tab if is already present; itπs at the bottom left of the IG-XL program.

Figure 26: Location of the Test Instances Tab.

2. If the Test Instances sheet is not present in the tab options:

∑ Click [Insert].

∑ Choose [Worksheet] and an Insert Worksheet window will appear.

∑ Under the Sheet Type options choose [Test Instances]. This will

create a Test Instances Sheet.

3. In the Test Instances Sheet, enter a new [Test Name] at an empty row. We use [Continuity] here.

4. Click on the three dots that located beside the Continuity name.

∑ This will open the Pin Pmu Instance Editor.

Text Box: Figure 27: Snapshot of Pin Pmu Instance Editor

5. Enter the following in the Pin Pmu Instance Editor.

∑ Choose A1, B1, Y1, A2, B2, Y2, A3, B3, Y3, A4, B4,and Y4 in the Pinlist column by clicking the three dot beside it.

∑ Enter [-0.1V] at the HiLimit column.

∑ Enter [-2V] at the LoLimit column.

∑ Enter [≠100uA] at the ForceCond1 column.

∑ Under the TimeSet pull-down option, select your [TSB] (Time Set

Basic) sheet.

∑ Under the Levels pull-down option, select your [Levels sheet].

∑ Under the AC Selector pull-down option, select the [Selector0].

∑ Under the AC Category pull-down option, select the [Cat0].

∑ Under the DC Selector pull-down option, select the [Selector0].

∑ Under the DC Category pull-down option, select [zerospecs].

6. Click [OK] when you are done.

∑ You will go back to the Test Instances window.

Section 11:Functional Test

The functional test is the test that will check whether the DUT is functioning according to its design.

1. In the Test Instances Sheet, enter [Functionality Test] at Test Name columm. Next, under the Type column, choose [IG-XL template]. Also under the Name column, choose [Functional_T]. Lastly, in the Called As column choose [Excel Macro].

2. In the DC Specs column

∑ Enter [CY7C128A-25] at the category sub-column.

∑ Enter [Typical] at the Selector sub-column.

3. In the AC Specs column,

∑ Enter [CY7C128A-25] at the category sub-column.

∑ Enter [Typical] at the Selector sub-column.

2. Click on the three dots that located beside the Func name.

∑ This will open the Functional Instance Editor.

Figure 28: Snapshot of the Functional Instance Editor

3. Enter the following in the Functional Instance Editor.

∑ Click on the [Disk Patterns] option and select your Pattern Tool file

that you had created.

∑ Under the TimeSet pull-down option, select your [TSB] (Time Set

Basic) sheet.

∑ Under the Levels pull-down option, select your [Levels] sheet.

∑ Under the AC Selector pull-down option, select the [Selector0].

∑ Under the AC Category pull-down option, select the [Cat0].

∑ Under the DC Selector pull-down option, select the [Selector0].

∑ Under the DC Category pull-down option, select [MM74HC86].

4. Click [OK] once you are done.

∑ The figure below is the snapshot of a completed Test Instances Sheet.

Figure 29: Snapshot of a Completed Test Instances sheet.

Section 11: Flow Table

1. Open the Flow Table sheet.

2. Enter the [Continuity] and [Func] in the Parameter column.

∑ This test name is the same name that you specified earlier in the Test Instances sheet.

3. Select [Test] at the Opcode column.

1) Below shows a completed Flow Table:

Figure 30: Snapshot of a Completed Flow Table sheet.

Section 12: Datalog

1. Click on the [10^th] button from the left on the IG-XL toolbar.

∑ A DataCollect Setup Window will appear.

Figure 31: Snapshot on the location of the Datalog Option

2. Check the [Datalog] option at the Data Collect option.

Figure 32: Snapshot on the location of the Datalog Option in the DataCollect

Setup Window

3. Click on the [Datalog] tab that is located on the top left of the DataCollect Setup window.

4. Click on the [Setups] button.

∑ This will open the Datalog Setups window.

Step 4

Figure 33: Snapshot on the location of the Setups Option

5. Click on the [Parametric Test] tab that is located on the top left corner of the window. Then click on the [Default] option under the Selected Setups column. Lastly, click on the [Editä] button and Parametric Test Setup window will open.

Figure 34: Snapshot on the Datalog Setups (Parametric Test Tab) window

6. In the Parametric Test Setup window, under the Display Format pull down option, select [test name, results and limits]. This will show the complete details on the results of the continuity test. Then click [OK].

Figure 35: Snapshot on the Parametric Test Setup window

7. Back at the Datalog Setups window, click on the [Functional Test] tab that is located on the top left corner of the window. Then click on the [Default] option under the Selected Setups column. Lastly, click on the [Editä] button and Functional Test Setup window will open.

Figure 36: Snapshot on the Datalog Setups (Functional Test Tab) window

8. In the Functional Test Setup window, under the Display Format pull down option. Select [test name, results and details]. Then check all the options on the right of the pull down option. This will show the complete details on the results of the Functional test. Then click [OK].

Figure 37: Snapshot on the Parametric Test Setup window

9. Click [OK] back at the Datalog Setups window.

Step 14: Running the Test Program

Click on the [5^th] button from the left on the IG-XL toolbar.

∑ This is the validate button that will check your program for any errors. If an error occurs, an Error sheet will appear. Fix the errors before continuing to the next step.

Figure 38: Snapshot on the location of the Validate Button

Click on the [15^th] button from the left on the IG-XL toolbar.

∑ This is the Run TDR button that will find the round trip delay from the

tester to the DUT.

Figure 39: Snapshot on the location of the Run TDR Button

Click on the [7^th] button from the left on the IG-XL toolbar.

∑ This is the Run button that will execute the test program.

Figure 40: Snapshot on the location of the Run Button

Once the program is done executing, the Teradyne_IG-XL_DataCollect - OutputWin window will appear. This is the window that shows the result of the test. Figure 40 shows the result of the continuity test. The red box shows the measured result of the test for each pin. The green box shows the results of the continuity test for each pin.

Figure 41: Snapshot of the Results Window on the Continuity Test.

Figure 41 shows the result of the Functional test. The red box shows the measured result of the test for each pin. The green box shows the results of the functional test for each pin. The blue box shows the overall result of the Functional test.

Figure 42: Snapshot of the Results Window on the Functional Test.